How does secondary ion mass Spectrometry work?
Secondary ion mass spectrometry is based on sputtering a few atomic layers from the surface of a sample using a primary ion beam and analyzing the emitted secondary ions, distinguished by their mass-to-charge ratio, and ejected from a sample with a mass spectrometer.
What is SIMS technique?
Secondary ion mass spectrometry (SIMS) is a technique capable of providing information about the elemental and isotopic composition of samples in situ from a few micrometers down to the sub-micron scale.
What can SIMS detect?
The SIMS technique provides a unique combination of extremely high sensitivity for all elements from Hydrogen to Uranium and above (detection limit down to ppb level for many elements), high lateral resolution imaging (down to 40 nm), and a very low background that allows high dynamic range (more than 5 decades).
What are the main differences between dynamic and static SIMS?
Static SIMS focuses solely on the first top monolayer, mostly for molecular characterization. Dynamic SIMS mode investigates bulk composition and in-depth distribution of trace elements, with a depth resolution from sub-nm to tens of nm. All CAMECA SIMS instruments are capable of dynamic SIMS.
What is TOF in analysis?
Time-of-Flight Secondary Ion Mass Spectrometry (ToF-SIMS) is a surface-sensitive analytical method that uses a pulsed ion beam (Cs or microfocused Ga) to remove molecules from the very outermost surface of the sample. The particles are removed from atomic monolayers on the surface (secondary ions).
What is TOF in MALDI-TOF?
Matrix-Assisted Laser Desorption/Ionization-Time Of Flight (MALDI-TOF) mass spectrometry (MS) is a common method used for quality control (QC) of oligonucleotides. The MALDI-TOF instrument uses pulses of laser light to vaporize the oligo/matrix in a process known as desorption.
What are the limitations of secondary ion mass spectrometer ( SIMS )?
Strengths and Limitations of Secondary Ion Mass Spectrometer (SIMS)? The analysis consumes very little sample (essentially non-destructive); for example, a typical U-Th-Pb analysis only consumes a few cubic micrometers of sample.
What kind of microanalytical instrumentation does CAMECA use?
CAMECA AT A GLANCE. CAMECA is a world leading supplier of microanalytical and metrology instrumentation for research and process control. Our instruments measure elemental and isotopic composition in materials down to atomic resolution and equip government and university labs as well as high-tech industrial companies around the world.
How are secondary ions analyzed in dynamic SIMS?
These ions are then accelerated, focused, and analyzed by a mass spectrometer. In “dynamic SIMS” mode the primary ion beam exceeds the “static limit” (~1E12 ions/cm 2) producing a high yield of secondary ions.
Which is an example of a secondary mass spectrometer?
For example, U-Th-Pb dating of zircon requires alternating analyses of unknown zircons with standard zircons in order to determine accurate U/Pb ratios and ages. The following literature can be used to further explore Secondary Ion Mass Spectrometer (SIMS)